zephyr/tests/drivers
Ramesh Babu B 5df7d93c82 tests: drivers: spi: Enable spi_loopback on RPL CRB
Configure through an overlay file, the rpl_crb board
for running the tests/drivers/spi/spi_loopback.

Signed-off-by: Ramesh Babu B <ramesh.babu.b@intel.com>
2023-03-21 13:39:33 +01:00
..
adc tests: drivers: adc_dma: fix buffer state not being verified 2023-03-20 16:29:24 +01:00
bbram tests: drivers: bbram: refactoring 2022-12-29 17:40:29 +01:00
build_all drivers/fpga: ice40: fix minimum config delay 2023-03-14 11:17:35 +01:00
can tests: drivers: can: timing: use recommended sample point 2023-03-11 19:45:00 +01:00
clock_control tests: clock_control: stm32h7: pll2: Fix test configuration 2023-01-04 16:51:57 +01:00
console tests: Tag console tests with additional tags 2023-01-10 18:29:35 -05:00
coredump/coredump_api yamllint: fix all yamllint truthy errors 2023-01-04 01:16:45 +09:00
counter tests: drivers: counter: maxim_ds3231: Remove unused test 2023-03-20 16:59:40 +01:00
dac tests: dac: esp32: API test for CI 2022-12-13 16:29:38 +00:00
disk drivers: disk: Decouple SDMMC and MMC Kconfigs 2023-02-08 10:18:13 +01:00
dma tests: drivers: dma: chen_blen_transfer: add bdma test to nucleo_h743zi 2023-03-01 15:58:27 +01:00
eeprom tests: drivers: eeprom: api: Replace prj_<board> files with overlays 2023-03-20 10:18:32 +01:00
entropy/api tests: Align zephyr,psa-crypto-rng node names with those used by SoCs 2023-02-07 14:26:18 +01:00
espi drivers: espi: enable ESPI_EMUL automatically 2022-12-22 11:06:18 +01:00
flash tests: drivers: flash: _ns target test case should be build only 2023-02-08 01:14:38 +09:00
flash_simulator tests/samples: use integration_plaforms in more tests/samples 2022-11-29 16:03:23 +01:00
fuel_gauge/sbs_gauge tests: remove test_framework tag from tests non-framework tests 2023-03-15 15:03:02 +01:00
gpio drivers: move gpio_keys from gpio to input 2023-03-14 17:15:09 -04:00
hwinfo/api tests/samples: fix some missing tags 2022-11-14 07:08:04 -05:00
i2c drivers: i2c: eeprom_target: switch to dedicated driver compatible 2023-02-21 18:03:11 -05:00
i2s tests: i2s_api: convert to new ztest API 2023-02-28 11:43:37 +01:00
input/gpio_keys drivers: move gpio_keys from gpio to input 2023-03-14 17:15:09 -04:00
ipm tests: move to using CONFIG_MP_MAX_NUM_CPUS 2022-10-20 22:04:10 +09:00
kscan/kscan_api tests: drivers: kscan: move to new ztest API 2022-09-09 16:24:20 -04:00
led/led_api tests: drviers: remove superfluous source files 2022-09-12 10:54:18 +00:00
memc/ram includes: prefer <zephyr/kernel.h> over <zephyr/zephyr.h> 2022-09-05 16:31:47 +02:00
mipi_dsi/api tests: drivers move the mipi dsi test to new ztest API 2022-09-01 15:33:25 -04:00
mm/sys_mm_drv_api tests/samples: fix some missing tags 2022-11-14 07:08:04 -05:00
pinctrl tests/samples: use integration_plaforms in more tests/samples 2022-11-29 16:03:23 +01:00
pwm boards: arm: mimxrt1024_evk: Added flexpwm pinctrl 2023-03-20 16:12:56 +01:00
regulator tests: drivers: regulator: fixed: Unify set of pins for nrf9160dk_nrf9160 2023-03-13 14:03:44 +01:00
retained_mem/api tests: drivers: Add API test for retained_mem 2023-03-20 15:02:09 +01:00
sdhc includes: prefer <zephyr/kernel.h> over <zephyr/zephyr.h> 2022-09-05 16:31:47 +02:00
sensor tests: remove test_framework tag from tests non-framework tests 2023-03-15 15:03:02 +01:00
spi tests: drivers: spi: Enable spi_loopback on RPL CRB 2023-03-21 13:39:33 +01:00
syscon ztest: remove the obsolete NULL appended to zassert macros 2022-09-09 07:05:38 -04:00
timer/nrf_rtc_timer tests: drivers: nrf_rtc_timer: Add a test case to check rescheduling 2023-02-14 08:28:28 +01:00
uart drivers: counter: Adapt to use device tree 2023-03-20 16:59:40 +01:00
udc tests: drivers: udc: fix udc_ep_try_config() test 2023-02-13 10:11:52 +01:00
virtualization/ivshmem/plain tests: drivers: virtualization: enable KVM support for ivshmem-plain 2022-12-10 09:47:26 +01:00
w1/w1_api tests: drivers: w1: Enable arduino_i2c and arduino_serial explicitly 2023-01-16 09:26:10 +01:00
watchdog drivers: counter: Adapt to use device tree 2023-03-20 16:59:40 +01:00