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zephyr/tests
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Tom Burdick 88de59043f tests: boards: frdm_k64f i2c test against fxos8700 
Adds a simple test case against the FXOS8700 sensor and its
built in FIFO using i2c. Pulls data from the sensor using both
synchronous and asynchronous transfers.

Signed-off-by: Tom Burdick <thomas.burdick@intel.com>
2022-08-11 14:12:13 -04:00
..
application_development test: fix more legacy #include paths 2022-08-02 16:41:41 +01:00
arch tests: arch: arm: arm_interrupt: Increase stack size 2022-08-11 12:15:11 +02:00
benchmarks test: fix more legacy #include paths 2022-08-02 16:41:41 +01:00
bluetooth Bluetooth: llcp: test: fix bsim test for eatt 2022-08-10 12:39:16 +02:00
boards tests: boards: frdm_k64f i2c test against fxos8700 2022-08-11 14:12:13 -04:00
boot/uefi tests: migrate includes to <zephyr/...> 2022-05-06 20:02:14 +02:00
cmake/config_dir cmake: APPLICATION_CONFIG_DIR support implemented 2021-11-10 08:25:36 -05:00
crypto test: fix more legacy #include paths 2022-08-02 16:41:41 +01:00
drivers tests: build_all: led: Enable various LED devices 2022-08-11 17:46:43 +02:00
kernel tests: kernel: move the multiprocessing test to new ztest 2022-08-11 12:19:59 +02:00
lib tests: lib: cmsis_nn: Initialise bias dimensions for depthwise convolve 2022-08-10 12:00:18 +02:00
misc test: fix more legacy #include paths 2022-08-02 16:41:41 +01:00
net tests: net: lib: move dns_addremove to new ztest API 2022-08-10 16:11:46 +02:00
posix test: fix more legacy #include paths 2022-08-02 16:41:41 +01:00
subsys modbus: remove label property from devicetree overlays 2022-08-11 09:39:24 -07:00
unit tests: unit: util: Add test for IS_EQ 2022-08-04 17:35:39 +01:00
ztest ztest: add test summary after all suites finish running 2022-08-11 09:01:12 -04:00