Remove the calls to configure the pinmux for GPIO for the RV32M1. These are
no longer needed after 9ba953d13a.
Signed-off-by: Henrik Brix Andersen <henrik@brixandersen.dk>
Adds a simple test case against the FXOS8700 sensor and its
built in FIFO using i2c. Pulls data from the sensor using both
synchronous and asynchronous transfers.
Signed-off-by: Tom Burdick <thomas.burdick@intel.com>
Although it is possible to simply use the interface number,
it has proven convenient to use the names for the interfaces
in the samples.
Migrate to DEVICE_DT_NAME().
Signed-off-by: Johann Fischer <johann.fischer@nordicsemi.no>
Add I2C based LED devices to led/app.overlay to get those associated
drivers enabled as part of the build test.
Signed-off-by: Kumar Gala <galak@kernel.org>
Having the LED device enabled in devicetree will now get the driver
enabled by default when CONFIG_LED=y is set. So we can remove
setting driver enabling Kconfig values in various .conf files.
Signed-off-by: Kumar Gala <galak@kernel.org>
Add test summary after all test suites finish running.
The summary can be one-line or verbose, which is configured
with CONFIG_ZTEST_VERBOSE_SUMMARY. The one-line summary covers
overall suite stats. The verbose summary covers each test
function within the suite besides the one-line summary.
The new ztest output ultimately go through the printk. If
printk go through the logging subsystem, there may be log
messages dropped. And if log_panic is invoked, log messages
can be flushed in a mess. So several explicit log flush
are used when printing summary to ensure no content is lost
and content is in good shape.
Some macros are shared between old and new ztests. Such as
TC_START_PRINT and TC_END_PRINT. The are defined accordingly.
Signed-off-by: Ming Shao <ming.shao@intel.com>
Increase stack size for test thread. With no optimization
default stack size may not be enough.
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
Increase timer timeout. 5ms timeout was too short for some
devices (e.g. with slow and blocking uart output).
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
When there is no external pull-up on the CSN line and the line
is put into the low-power mode (input direction and disconnected
buffer), after some time its level falls to low and some flash
chips, like for example MX25R64, exit the Deep Power-down mode
when that happens. To prevent this, activate the GPIO internal
pull-up for this line in boards that do not have the external
pull-up on it.
Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
This commit enables the assert test mode (`CONFIG_ASSERT_TEST`) for the
ARM interrupt test because it relies on the assert function to return
without aborting in the "Assert occurring inside kernel panic" test.
Signed-off-by: Stephanos Ioannidis <root@stephanos.io>
This commit enables the assert test mode (`CONFIG_ASSERT_TEST`) for the
ARM interrupt test because it relies on the assert function to return
without aborting in the in-ISR "Intentional assert" test.
Signed-off-by: Stephanos Ioannidis <root@stephanos.io>
This commit enables the assert test mode (`CONFIG_ASSERT_TEST`) for the
ztest error hook test because it implements a custom post assert fail
hook (`ztest_post_assert_fail_hook`) that returns without aborting to
faciliate the testing of the assert functions.
Signed-off-by: Stephanos Ioannidis <root@stephanos.io>
The Babblesim test for eatt for reconfiguration of MTU is not
foolproof. Central actually generates two mtu update events.
This is fixed by only setting the reconfigured flag when the MTU actually
changes to the new values
In the Babblesim test for eatt for collision the peripheral
needs to sync with central to ensure collisions occur.
Signed-off-by: Andries Kruithof <andries.kruithof@nordicsemi.no>
This commit adds an initialisation for the `bias_dims` variable, which
is given as an input to the `arm_depthwise_conv_s8` function.
Note that the `bias_dims` parameter is currently unused by the function
implementation.
This fixes the following warning reported by the GCC 12:
error: 'bias_dims' may be used uninitialized
Werror=maybe-uninitialized]
Signed-off-by: Stephanos Ioannidis <root@stephanos.io>
Remove NET_CONFIG_IEEE802154_DEV_NAME in favor of DT based choice using
zephyr,ieee802154.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
Use a test compatible so that test can create a DT-based device and
provide a valid choice when building the test.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
All IEEE 802.15.4 tests use internal fake devices, so use native_posix
platform to run them as they are not meant to test IEEE 802.15.4 on
hardware.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
- Use a native_posix specific overlay for non-SoC devices
- Remove redundant per-driver Kconfig selections
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
Updates the ztest_test_fail() function to allow failures in setup.
When executed, a failed assert will fail every test in the suite owning
the setup function. This was verified by adding a suite which asserts
in the setup function and has a test that should pass. During
exeuction, ztest marks the test as failing.
In order to verify exection I also added 2 new APIs:
- ZTEST_EXPECT_FAIL(suite_name, test_name)
- ZTEST_EXPECT_SKIP(suite_name, test_name)
Signed-off-by: Yuval Peress <peress@google.com>
The def command Indicates that a comment block contains documentation
for a #define macro. This is useful if the comment block documents a
macro not adjacent to it, e.g.
```c
/**
* @def MAX(x,y)
* @brief Computes the maximum of @a x and @a y.
*/
#ifdef XXX
#define MAX(x,y) ...
#endif
```
However, it is not necessary if the comment is adjacent to the
definition, e.g.
```c
/**
* @brief Computes the maximum of @a x and @a y.
*/
#define MAX(x,y) ...
```
This patch removes all unnecessary def entries in-tree.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
If the test is run with the config NO_OPTIMIZATIONS enabled then the
stack size usage increases by around 80% for ARM platforms.
Increase the stack size used in test cases that enables building with no
optimizations for ARM.
Update description on TEST_ARM_CORTEX_M since it was outdated and said
it was only used for a single purpose.
Fixes: #47930Fixes: #47929Fixes: #47855
Signed-off-by: Joakim Andersson <joakim.andersson@nordicsemi.no>
Disable unstable tests cases for mps2_an385, which fail sporadically
due to timer stability issues on that platform (see #48608).
Signed-off-by: Robert Lubos <robert.lubos@nordicsemi.no>
In the continuation of the previous commit, replace _OPT_ by _DOMAIN_
in macros relating to this feature.
hen, adapt drivers and tests to this new wording.
Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
* Move test to using devicetree for various "device" params.
* Move test to using spi_dt_spec to simplify code
Signed-off-by: Kumar Gala <galak@kernel.org>
Loosen some timing constraints in order to hack arond spurious
failures in upstream Zephyr's CI while working on an unrelated task.
Signed-off-by: Martí Bolívar <marti.bolivar@nordicsemi.no>
Loosen some timing constraints in order to hack arond spurious
failures in upstream Zephyr's CI while working on an unrelated task.
Signed-off-by: Martí Bolívar <marti.bolivar@nordicsemi.no>
Add two new utility macros for iterating over the entire tree, along
with tests.
I have a use case for DT_FOREACH_STATUS_OKAY_NODE() right now, but I
think it makes sense to define both of them right away for
completeness.
Signed-off-by: Martí Bolívar <marti.bolivar@nordicsemi.no>
Update all the tests for openthread to the new ztest API and the
FFF framework. Splitting this into 2 commits was proving very
difficult so it's a single commit instead.
Signed-off-by: Yuval Peress <peress@google.com>
Enabled Multiple Notifications and added command for
bt_gatt_notify_multiple().
Increased possible number of connections to execute GATT/SR/GAN/BV-02-C
Signed-off-by: Krzysztof Kopyściński <krzysztof.kopyscinski@codecoup.pl>
This driver can't be compiled on all platforms as it's a NXP specific
driver (requires NXP HAL). Because spi.dtsi file is used by app.overlay
(and so enabled in multiple configs, including native_posix) it needs to
be removed. Note that MCR20A driver is already covered by the
ieee802154.build.mcr20a test case, which runs specifically on a NXP
board.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
If assert triggers, display the current state in order not
to confuse assert message reader.
Same logic is used for following asserts.
Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
