This test is quite heavy and long in simulation,
but its length is meant to find unlikely issues which
may be triggered only very rarely.
Let's provide a kconfig value to chose how long the
test is, and set it to a lower value when running in simulation
(in CI) to save time.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Increase the UART speed to 1Mbps for the simulated nrf52
to reduce the amount of time spent busy waiting, and
therefore the real time duration of the test.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
filtering by CONFIG_SERIAL always matches, we need a different filter
and be able to enable the driver if supported.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
Adding a hook for tests to inject a mock transport and migrating the
accel test to test bmi160 specific things. The old version of the test
which checks for read values is now covered by the generic test in
the sensor build_all target.
Signed-off-by: Yuval Peress <peress@google.com>
The logic in the driver was not aligned to the datasheet. Also,
temperature reading was not being done in fetch, but in channel_get.
There was also some extra conversions from SI->register->SI when
setting the range, this was causing the register value calculation to
produce an incorrect scale in some cases.
Tests were added to cover these cases.
Signed-off-by: Yuval Peress <peress@google.com>
Update the backend for sensor emulators to include a function for
setting the offset as well as a function to query an attribute's
metadata such as bounds and increment size. Additionally, add
backend support for setting the _xyz channel values.
Make the appropriate test changes to accomodate.
Signed-off-by: Yuval Peress <peress@google.com>
Add the nrf52_bsim to the platform_allow list
for tests which had such a filter.
Note that for this test to pass, you need
to connect the uart in loopback, passing the command
line option `-uart0_loopback` to zephyr.exe
Note this tests do not run right now by default in CI
as the fixture is preventing it.
They can be run with:
twister -T tests/drivers/uart/ -v -p nrf52_bsim \
--fixture gpio_loopback -- -uart0_loopback
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
These tests were filtering by CONFIG_UART_CONSOLE,
but that does not seem a strick requirement.
It seems the requirement would just be CONFIG_SERIAL,
but that is implicit if CONFIG_SERIAL_SUPPORT_ASYNC,
which is required for all these tests, so let's
just remove CONFIG_UART_CONSOLE.
(The simulated nrf5x boards do not set CONFIG_UART_CONSOLE
by default, as by default the console is routed to the
process stdout instead)
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
The option CONFIG_NATIVE_UART_0_ON_STDINOUT
is only usable for the native_sim/posix(_64) targets,
but this test is only allowed for the nrf52840dk_nrf52840.
Building with this option set causes a kconfig warning.
Let's just remove it.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
On the async configurations, the first part of the test
(test_uart_pm_in_idle) can interfere with the second part
of the test, if the device has a fast enough CPU.
This is due to the first part of the test ending
as soon as it queues the last byte for transmission.
If the device is fast enough (and the simulated
nrf52 is), the 2nd part of the test will start executing
enabling the UART Rx, which can result in either
the Rx being enabled mid frame, which can result in a frame
error or even before the Tx HW started pushing the byte
in the line (resulting in that byte being received).
Neither of these cases are handled by the 2nd test,
which sees a spurious error or received byte
and fails.
Let's just add a small delay at the end of the first test
to allow the Tx of the last byte to be done.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Add emulation testing for it8xxx2, npcx, and mcp7940n. The test is made
to be generic and uses the backend API in order to verify both read and
write functionality. Additional tests are made for the API's limits when
reading/writing out of bounds.
Fixes#65018
Signed-off-by: Yuval Peress <peress@google.com>
This is a driver targetting the Bosch BMA 4-series accelerometers. It
has been specifically developed for the BMA422 but should be compatible
with others in that line, excepting the BMA400. Supports key attributes
and async RTIO one-shot operation. I2C operation is supported, with
stubs for a SPI implementation provided for future improvement.
Signed-off-by: Tristan Honscheid <honscheid@google.com>
Add internal loopback for testing purposes and
change wroom for wrover, which is default board
for testing.
Signed-off-by: Lucas Tamborrino <lucas.tamborrino@espressif.com>
Some MCU have limitations with GPIO interrupts. Add a polling mode to
the gpio-keys driver to support those cases.
This required a bit of a refactoring of the driver data structure to add
a instance wide data, and move the pin specific pointer in the config
structure.
For polling, reuse the button 0 delayed work so we minimize the resource
waste, the two work handler functions are only referenced when used so
at least those are discarded automatically if no instance needs them.
Fix a bug in the PM structure instantiation as well.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
__bswap_ in zephyr/sys/byteorder.h conflicts with __bswap_ in host's
byteswap.h. byteswap.h from host compiler used in posix_native_64 boards
causes a compilation issue.
This commit renames __bswap_ to BSWAP_ to prevent collision.
Before this commit a compilation error can be created by adding #include
<byteswap.h> to samples/net/sockets/echo/src/socket_echo.c
This does not change external API to byteorder.h, but does change
internal implementation which some other source files depend on.
Replaced manual byteswap operations in devmem_service.c with APIs from
byteorder.h which automatically converts to CPU endianess when necessary.
Fixes#44324
Signed-off-by: Jonathan Hamberg <jonathanhamberg@gmail.com>
Add an input driver to read data from an analog device, such as a
thumbstick, connected to an ADC channel, and report it as an input
device.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
For uart_async_api, uart_mix_fifo_poll & uart_pm:
These test can be run fine in the simulated nrf52_bsim board,
just connecting the UART Tx and Rx in loopback,
but we need an overlay just like for the real boards.
Let's provide it.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
For some reason the host gcc (11 & 12) does not believe
rx_buf_size is constant. Let's work around it by using the
sizeof() expression it is initialized to instead.
This fixes a build error when targetting native targets
which use the host gcc:
tests/drivers/uart/uart_async_api/src/test_uart_async.c:236:34:
error: expression in static assertion is not constant
236 | BUILD_ASSERT(rx_buf_size <=
sizeof(tdata.rx_first_buffer), "Invalid buf size");
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
The test was actually filtered out in the integration platforms
(native_sim) as SERIAL was not enabled in its prj.conf
and that is not enabled by default for this target.
Let's just enable it.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Use the common io-channel-cells name "input" instead of "positive" and
"negative" to make this binding work with the various ADC DT macros.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
- Support for listing both testcases and testsuites
- Support for running single suites or single test cases
- Support shuffling tests and repeating execution based on command line
arguments.
For example, build with
west build -p -b qemu_cortex_m3 tests/kernel/sleep -t run -- \
-DCONFIG_ZTEST_SHUFFLE=y -DCONFIG_ZTEST_SHELL=y
Following commands are available:
uart:~$ ztest
ztest - Ztest commands
Subcommands:
run-all :Run all tests
shuffle :Shuffle tests
list-testsuites :List all test suites
list-testcases :List all test cases
run-testsuite :Run test suite
run-testcase :Run testcase
shuffle accepts two arguments --suite_iter and --case_iter which allows
repeated exercution of testcases or suites.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
Physical boards work on these tests but some of the required
peripherals are not simulated by `renode`, executing the tests
with renode-simulated board in CI will fail.
Exclude `renode` simulation from these tests.
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
The zephyr-gpio w1 driver introduced in this commit implements
all routines for the w1 api on top of the zephyr gpio driver.
W1 bit read, write, and reset operations are executed by
bit-banging the selected gpio.
Signed-off-by: Hudson C. Dalpra <hudson@bduncanltd.com>
Implement level based gpio interrupts, by using a worker queue to
repeatedly call the gpio callbacks until the gpio is no longer active.
Update unit test for new interrupts.
Bug #66401
Signed-off-by: Jeremy Bettis <jbettis@google.com>
Add a unittest for 100% of the lines in gpio_ite_it8xxx2_v2. The test
fakes the registers by overriding the ECREG macro to call a function
provided by the test.
Does not test the code guarded by
CONFIG_SOC_IT8XXX2_GPIO_GROUP_K_L_DEFAULT_PULL_DOWN
Bug #66401
Signed-off-by: Jeremy Bettis <jbettis@google.com>
Add an option to enable a input_kbd_matrix_actual_key_mask_set API to
enable or disable keys dynamically in the mask. This can be useful if
the exact key mask is determined in runtime and the device is using a
single firmware for multiple matrix configurations.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
Config the sram0 to be non-cachable to PASS the DMA testcases
chan_blen_transfer and loop_transfer
on the stm32f746zg and stm32f767zi nucleo boards.
The CONFIG_NOCACHE_MEMORY is useless as the memory region
gets the NOCACHE ATTRibutes for stm32H7 or stm32F7 as well.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Add a device driver to read events from a Linux evdev device node and
inject them back as Zephyr input events.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
Generic Connector for the apollo4p_evb
Ran tests/drivers/gpio/gpio_basic_api
Ambiq does not support DUAL Edged Interrupts.
Added Connector Usages as defined by the Ambiq BSP.
Signed-off-by: Richard Wheatley <richard.wheatley@ambiq.com>
The LIS2DU12 is a linear 3-axis accelerometer with advanced digital
functions whose MEMS and ASIC have been expressly designed to build
an outstanding ultralow-power architecture in which the anti-aliasing
filter operates with a current consumption among the lowest in the
market.
This driver is based on stmemsc HAL i/f v2.3
https://www.st.com/en/datasheet/lis2du12.pdf
Signed-off-by: Armando Visconti <armando.visconti@st.com>
Eliminates dma tests' dependency on CONFIG_NOCACHE_MEMORY=y for
configuring dma data linker sections. This allows optionally relocating
dma source and destination data to sram or other custom linker section
on boards that don't support dma access to flash.
Signed-off-by: Maureen Helm <maureen.helm@analog.com>
Add support for enabling the clock security system, which can detect
failures of the HSE clock.
Includes tests for nucleo_h743zi and nucleo_g474re.
Signed-off-by: Kevin ORourke <kevin.orourke@ferroamp.se>
Add test case for all drivers that are supporting the die temperature
feature, and fix right away all the yet undiscovered issues.
Signed-off-by: Armando Visconti <armando.visconti@st.com>
Rename the native Linux SocketCAN driver to reflect that it can can now be
used in both native_posix and native_sim (with or without an embedded
C-library).
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
With TF-M enabled the storage_partition can be used as memory that is
known to be configured as non-secure flash region.
The slot1_ns_partition partition is only correct when TF-M is built
with BL2 enabled.
Signed-off-by: Joakim Andersson <joakim.andersson@nordicsemi.no>
Enable code coverage for debug.coredump.drivers.api.* test suite
adding custom fatal error handler to dump code coverage data
when the test halts as expected.
Signed-off-by: Dmitrii Golovanov <dmitrii.golovanov@intel.com>
Add an optional actual-key-mask property to filter out key combinations
that are not implemented in the actual keyboard matrix.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
The driver has some non trivial macro setup, add another two test cases
so those gets build tested as well.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
Add support for testing the `dma_emul` driver which simply uses
software emulation (i.e. asynchronous memcpy in a workqueue) for
performing DMA operations.
Signed-off-by: Christopher Friedt <cfriedt@meta.com>
The LPS28DFW is an ultracompact, piezoresistive, absolute pressure sensor.
Compared to the LPS22DF, the LPS28DFW is waterproof and has a Dual FS
capability and does not have SPI. This commit extends the LPS22DF driver to
be compatible with the LPS28DFW device.
Signed-off-by: Jonas Remmert <j.remmert@phytec.de>
Fix the test filter, to allow any POSIX arch board,
instead of just native_posix, as this test runs fine
on all of them.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Switch the native overlays to be based on the native_sim one,
and set native_sim as the integration_platform
instead of native_posix
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Add tests for line splitting in console echo and console_getline()
Signed-off-by: Jakub Michalski <jmichalski@internships.antmicro.com>
Signed-off-by: Mateusz Sierszulski <msierszulski@antmicro.com>
Added an overlay file for mimxrt1170_evk_cm33 to test rtio
with the spi_loopback test.
Added mimxrt1170_evk_cm7 to the testcase.yml file
Signed-off-by: Emilio Benavente <emilio.benavente@nxp.com>
The option is long gone, PR was sitting for a long time so this got
merged and now it's failing compliance check.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
This testsuite exercises a number of things. Namely
* `mutable` devices (i.e. those backed in SRAM)
* `uart_emul` support for interrupt mode (receive only)
* `devmux` capabilities of multiplexing several uarts
* switching the system console between several uart backends
Testing Done:
```
west build -p auto -b qemu_riscv64 -t run \
tests/drivers/console_switching/
...
*** Booting Zephyr OS build zephyr-v3.4.0-3988-gaaefb2d764ea ***
Running TESTSUITE console_switching
================================================================
START - test_read
read "Hello, uart_emul0!" from uart_emul0
read "Hello, uart_emul1!" from uart_emul1
read "Hello, uart_emul0!" from uart_emul0
read "Hello, uart_emul1!" from uart_emul1
PASS - test_read in 0.005 seconds
================================================================
START - test_write
wrote "Hello, uart_emul0!" to uart_emul0
wrote "Hello, uart_emul1!" to uart_emul1
wrote "Hello, uart_emul0!" to uart_emul0
wrote "Hello, uart_emul1!" to uart_emul1
PASS - test_write in 0.003 seconds
================================================================
TESTSUITE console_switching succeeded
------ TESTSUITE SUMMARY START ------
SUITE PASS - 100.00% [console_switching]: pass = 2, fail = 0,...
- PASS - [console_switching.test_read] duration = 0.005 seconds
- PASS - [console_switching.test_write] duration = 0.003 seconds
------ TESTSUITE SUMMARY END ------
===============================================================
PROJECT EXECUTION SUCCESSFUL
```
Signed-off-by: Christopher Friedt <cfriedt@meta.com>
Enable all these tests which run in native_posix in native_sim,
Switch from native_posix to native_sim as default test platform
And switch native_posix overlays to native_sim.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Enable this test which run in native_posix_64 in native_sim_64,
And switch native_posix_64 overlays to native_sim_64.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
This driver assumed the ivshmem-v2 output sections would be mapped
contiguously, which is no longer true.
Modify eth_ivshmem to treat each output section independently
Signed-off-by: Grant Ramsay <gramsay@enphaseenergy.com>
Several scenarios in this test require specific external flash chips
to be connected to the nRF52840 DK. Specify proper fixture for them
so that they are not performed on the board without those required
external components connected.
Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
This is a follow-up to commit 7a83724e0f.
This overlay uses an alternative connection (via spi2) for the external
flash present on the nRF52840 DK and it needs to use one of the QSPI
pins as GPIO, to get CS line control in the SPI communication. To make
it possible, that GPIO must be removed from those marked as reserved.
Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
Switch from native_posix to native_sim as default test platform
And switch overlays to native_sim.
For gpio_enable_disable_interrupt, also filter with
platform_allow to save time, as the dt filter requires cmake
to be run, but only the platforms with overlays provided
by the test can be run.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Switch from native_posix to native_sim as default test platform
And switch overlays to native_sim.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Switch from native_posix to native_sim as default
test platform, switch overlays to native_sim.
For the HW test, filter whole posix arch to speed
up twister run.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Switch from native_posix to native_sim as default test platform.
For test with overlays, switch overlays and platform_allow from
native_posix to native_sim.
For tests without overlays, enable also in native_sim, and
set native_sim as integration platform.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Switch from native_posix to native_sim as default test platform
And switch overlays to native_sim.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Clean up few build all device instances to use the test_gpio node and
different gpio numbers. Makes them somewhat more representative of what
an actual instance would look like.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
Enable for native_sim.
and switch from native_posix to native_sim as default
test platform
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Enable for native_sim.
and switch from native_posix to native_sim as default
test platform
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Adds a clock control device for a PWM node, allowing the PWM
to be controlled using the clock control API.
It is a similar idea to the device driver in linux:
linux/Documentation/devicetree/bindings/clock/pwm-clock.yaml
Signed-off-by: Andriy Gelman <andriy.gelman@gmail.com>
Fixes an unhandled interrupt runtime crash if CONFIG_SPI_XMC4XXX_DMA=y and
CONFIG_SPI_XMC4XXX_INTERRUPT=n.
The unhandled interrupt error is triggered because irq_enable() was called
without calling IRQ_CONNECT() when CONFIG_SPI_XMC4XXX_INTERRUPT=n.
Signed-off-by: Andriy Gelman <andriy.gelman@gmail.com>
* Fix app path in documentation
* Move the at24 emulator overlays to be general instead of
native_posix specific
* Switch default test platform from native_posix to native_sim
* From build only test, exclude platforms which are used
in the build and run test.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Switch the overlays and default test platform to native_sim
from native_posix.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
The LPS22DF is an ultracompact, piezoresistive, absolute pressure sensor
that functions as a digital output barometer. The LPS22DF provides lower
power consumption, achieving lower pressure noise than its predecessor.
This driver is based on stmemsc HAL i/f v2.3
https://www.st.com/en/datasheet/lps22df.pdf
Signed-off-by: Armando Visconti <armando.visconti@st.com>
This fixes multiple CI issues for the ads1145s0x
driver.
Having a special testcase for the driver limits the
CONFIG_ADC=y and CONFIG_ADC_INIT_PRIORITY adjustment
requirements.
Also fixes address not matching warning for pcal6416a@2
Signed-off-by: Nick Ward <nix.ward@gmail.com>
Commit eb44414af9 modified
test_single_read for early rx buf release.
The commit assumed that tdata.last_rx_buf points to either &tdata.rx_buf[0]
if the driver releases the first buffer or at &rx_buf[5] if the first
buffer is not released. However, where tdata.last_rx_buf points to depends
on the timeout given to uart_rx_enable(), making the test flaky.
This commit modifies the test by keeping track how many bytes have been
received in the first and second buffers.
The function tdata_check_recv_buffer() validates that the sent data
matches the received bytes which may have been split between first and
second buffer.
This fixes the uart_async_api test on the xmc45_relax_kit.
Signed-off-by: Andriy Gelman <andriy.gelman@gmail.com>
On the STM32H735G-DK Discovery kit, when connecting a UART from
pin PF7 to PF6, the test uart_async_api passes now.
Signed-off-by: Benjamin Deuter <benjamin.deuter@gmail.com>
Support NXP MRT on LPC55XXX SOC series, enable on
lpcxpresso55s69_cpu0, add test overlay to counter basic api test
Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
Remove the `app.overlay` file which has been
wrongly added in ad3c5a2 commit. Instead of that
add the ad5592-adc node into `native_posix.overlay` file.
Signed-off-by: Bartosz Bilas <b.bilas@grinn-global.com>
Twister treats board revisions as separate boards, so s32z270dc2_r52
revision D must be added to the filters.
Signed-off-by: Manuel Argüelles <manuel.arguelles@nxp.com>
Add basic support for ams TSL2561 light sensor. Triggers, attributes
and manual integration time are currently not supported.
Signed-off-by: Gustavo Silva <gustavograzs@gmail.com>
Added initial version of Infineon AIROC WIFI driver
Added initial version of binding file for Infineon AIROC WIFI
driver
Rename CONFIG_ABSTRACTION_RTOS_COMPONENT_ZEPHYR to
CONFIG_USE_INFINEON_ABSTRACTION_RTOS
Exclude cy8cproto_062_4343w platform from
drivers.modem.esp_at.build test
Change revision hal_infineon to
69c883d3bd9fac8a18dd8384624b8c472a68d06f
Signed-off-by: Nazar Palamar <nazar.palamar@infineon.com>
Adjust the reg of the CS gpios to fix the warning
about the same value used for all existing nodes.
Signed-off-by: Bartosz Bilas <b.bilas@grinn-global.com>
Add test for card insertion interrupt to SDHC test.
The test will now wait for the card insertion interrupt whenever it is
run without a card in the slot. By inserting a card, the user can verify
that card insertion interrupts work correctly, as this should notify the
test and allow it to proceed.
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
Add in DT the possibility to configure both INT1 and INT2
pin. The driver will then assign one of the two (either 1
or 2, according to what value drdy_pin is set) to a gpio
for receiving drdy interrupts.
The other pin may be used in the future to receive event
interrupts.
Signed-off-by: Armando Visconti <armando.visconti@st.com>
Add the following improvements to the spi_loopback async test:
- Verify that a set of multiple spi_buf structures can be sent
successfully
- Check that the contents of the RX and TX buffers match after transfer
completion
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
Add synchronization using semaphores for the UART ISR tx/rx
tests, instead of relying on a single k_yield() call to
ensure all UART ISR work can be completed before validating
the result.
Signed-off-by: Bjarki Arge Andreasen <bjarkix123@gmail.com>
Most tests define a buffer for UART data on the stack,
including the tests testing UART IRQ. Move buffers to
static memory, within the test fixture, which can then
be passed as the user_data to the UART IRQ callback.
Signed-off-by: Bjarki Arge Andreasen <bjarkix123@gmail.com>
This test assumes it can use all configured
NRF_RTC_TIMER_USER_CHAN_COUNT,
But the sync RTC code uses one while it synchronizes.
Let's just disable it the sync rtc.
This fixes an issue where the test fails for a simulated
nrf5340.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Unify spelling of CAN Flexible Data-rate abbreviation to "CAN FD" instead
of "CAN-FD". The former aligns with the CAN in Automation (CiA)
recommendation.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
Define the storage_partition in the internal flash
instead of the external NOR qspi flash,
so the testcase can PASS on the disco_l4754_iot1 board.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Fix the labels used in io-channels to be consistent in whole
tests/drivers/build_all/sensor/adc.dtsi file.
Signed-off-by: Franciszek Zdobylak <fzdobylak@antmicro.com>
This commit adds utilites to parse the RMC and GGA
NMEA0183 messages, which contain all data which shall be
published using the struct gnss_data.
It also adds a test suite for the added utilities.
Signed-off-by: Bjarki Arge Andreasen <bjarkix123@gmail.com>
